Machine vision automated visual inspection : theory, practice and applications מאת Beyerer, Jurgen, Puente Leon, Fernando 1969-, Frese, Christian

Available for University of the Philippines System via SpringerLink. Click here to access
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Optical inspection of sub-surface defects using digital shearography and statistical fringe analysis מאת Catalan, Francesca Celine I.

Optical characterization of semiconductors infrared, raman, and photoluminescence spectroscopy מאת Perkowitz, S.

Available for University of the Philippines System via ScienceDirect. Click here to access
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