Characterisation and control of defects in semiconductors

Available for University of the Philippines Diliman via IET Digital Library. Click here to access
Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy

Characterization of silicon p-n junctions fabricated by ion shower doping Autor Diaz, Jose Mario A.

Mathematical modeling of implant dose and characterization of P-N junctions formed by ion shower technology (IST) Autor Madrid, Pepe L.

Ion-solid interactions fundamentals and applications Autor Nastasi, Michael Anthony 1950-

Ion beam processing of materials and deposition processes of protective coatings A volume in European materials research society symposia proceedings

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy

Ion implantation technology-92

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy

Modifications induced by irradiation in glasses a volume in European materials research society symposia proceedings

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy

Ion implantation and beam processing. Autor Williams, J.S

Ion implantation in semiconductors, silicon and germanium Autor Mayer, James W. 1930-, Eriksson, Lennart 1938-, Davies, John Arthur 1927-

Available for University of the Philippines System via ScienceDirect. Click here to access
Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy

Surface modification of kapton polyimide using a DC-powered ion shower system Autor Flores, Jose Cornelio M.