RILEM recommendations for the prevention of damage by alkali-aggregate reactions in new concrete structures state-of-the-art report of the RILEM Technical Committee 219-ACS

Available for University of the Philippines System via SpringerLink. Click here to access
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Light-induced defects in semiconductors 由 Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato 1951-

Available for University of the Philippines Diliman College of Engineering via CRCnetBASE. Click here to access
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Modeling the effect of damage in composite structures simplified approaches 由 Kassapoglou, Christos

Defects and damage in composite materials and structures 由 Heslehurst, Rikard Benton

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Concrete repair to EN 1504 diagnosis, design, principles and practice 由 Raupach, Michael, Bèuttner, Till

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Dopants and defects in semiconductors 由 McCluskey, Matthew D., Haller, Eugene E.

Building surveys and reports 由 Douglas, James

Wire bonding in microelectronics 由 Harman, George G.

Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access
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The practical guide to defect prevention 由 McDonald, Marc

High-speed VLSI interconnections 由 Goel, Ashok K. 1953-