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  1. 1

    Power optimized partial scan BIST implementation on DLX microprocessor nork Buenaventura, Arvi D.

    Tesis


    Azala
  2. 2

    Automatic testing and evaluation of digital integrated circuits nork Healy, James Thomas 1940-

    Argitaratua 1981
    Liburua


    Azala
  3. 3

    Power reduction techniques and BIST implementation on a DLX microprocessor using a 90nm CMOS process nork Agbayani, Jay-ar Anacleto

    Argitaratua 2010
    Tesis


    Azala
  4. 4

    Tutorial test generation for VLSI chips

    Argitaratua 1988
    Liburua


    Azala

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