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  1. 1

    Power optimized partial scan BIST implementation on DLX microprocessor by Buenaventura, Arvi D.

    Thesis


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  2. 2

    Automatic testing and evaluation of digital integrated circuits by Healy, James Thomas 1940-

    Published 1981
    Book


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  3. 3

    Power reduction techniques and BIST implementation on a DLX microprocessor using a 90nm CMOS process by Agbayani, Jay-ar Anacleto

    Published 2010
    Thesis


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  4. 4

    Tutorial test generation for VLSI chips

    Published 1988
    Book


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