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CLASSIFICATION:
T - Technology
SUBJECT:
Materials
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Microscopy
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CLASSIFICATION:
T - Technology
SUBJECT:
Materials
AND
Microscopy
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Applied scanning probe methods VI characterization
Published 2007
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Transmission electron microscopy a textbook for materials science
by
Williams, David B. 1949-
Published 1996
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Advances in acoustic microscopy
Published 1995
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Electron microscopy and analysis 1995 proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Birmingham, 12-15 September 1995 Inst...
Published 1995
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Application of positron spectroscopy to materials science report of a workshop held in Rancho Mirage, USA, September 9-11, 1992
Published 1994
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Structural and chemical analysis of materials X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy
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Eberhart, J. P. (Jean Pierre)
Published 1991
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Optical microscopy for the materials sciences Monographs and textbooks in material science
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Richardson, James H. (James Harold), 1899-
Published 1971
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CAMPUS
Diliman
7
DATABASE
Union Catalog (Buklod)
7
UNIT LIBRARY
College of Engineering Library II
4
College of Engineering Library I
2
College of Science
1
YEAR OF PUBLICATION
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To:
CLASSIFICATION
T - Technology
SUBJECT
Materials
Microscopy
Acoustic microscopy
1
Analysis
1
Electron microscopy
1
Industrial applications
1
Metallography
1
Microstructure
1
Photomicrography
1
Positrons
1
Scanning probe microscopy
1
Transmission electron microscopy
1
see all ...
AUTHOR
Bhushan, Bharat 1949-
1
Briggs, Andrew
1
Carter, C. Barry
1
Cherns, David
1
Eberhart, J. P. (Jean Pierre)
1
Electron Microscopy and Analysis Group
1
Hulett, L. D.
1
Institute of Physics (Great Britain)
1
Kawata, Satoshi 1966-
1
Richardson, James H. (James Harold), 1899-
1
Royal Microscopical Society (Great Britain)
1
Williams, David B. 1949-
1
see all ...
RESOURCE TYPE
Book
7
LANGUAGE
English
7
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