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CLASSIFICATION:
Q - Science
SUBJECT:
Electron microscopy
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CLASSIFICATION:
Q - Science
SUBJECT:
Electron microscopy
Search Results - "Diffraction."
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"Diffraction."
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High-energy electron diffraction and microscopy
by
Peng, L.-M
Published 2004
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Elastic and inelastic scattering in electron diffraction and imaging
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Wang, Zhong Lin
Published 1995
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Evaluation of advanced semiconductor materials by electron microscopy
Published 1989
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CAMPUS
Diliman
3
DATABASE
Union Catalog (Buklod)
3
UNIT LIBRARY
College of Engineering Library I
2
College of Engineering Library II
1
YEAR OF PUBLICATION
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CLASSIFICATION
Q - Science
SUBJECT
Electron microscopy
Diffraction
2
Electrons
2
High energy electron diffraction
1
Imaging systems
1
Materials science
1
Scattering (Physics)
1
Semiconductors
1
Surfaces
1
Technique
1
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AUTHOR
Cherns, David
1
Dudarev, S. L.
1
NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1988 : Bristol, England)
1
North Atlantic Treaty Organization. Scientific Affairs Division
1
Peng, L.-M
1
Special Program on Condensed Systems of Low Dimensionality (NATO)
1
Wang, Zhong Lin
1
Whelan, M. J.
1
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RESOURCE TYPE
Book
3
LANGUAGE
English
3
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