00000cmm a22000004i 4500 UP-99796217613765216 Buklod 20210622093956.0 m |o d | cr || |||a|a|a 191204t20192019xx a eng d 9781785616563 (e-ISBN) (iLib)UPD-00524273895 DLC DENGII rda eng TK 7871.85 C43 2019eb Characterisation and control of defects in semiconductors Filip Tuomisto, editor. London, United Kingdom The Institution of Engineering and Technology [2019] 1 online resource. text rdacontent computer rdamedia online resource rdacarrier IP-based subscription, on campus and remote access. Access via Electronic Resources of the UPD Engineering Library and University Library websites. Electronic reproduction. London, United Kingdom IET 2019. Available via World Wide Web through IET Digital Library. Ion implantation. Magnetic resonance. Semiconductor doping. Semiconductors Materials. Silicon. Electronic books. Tuomisto, Filip editor. Available for University of the Philippines Diliman via IET Digital Library. Click here to access https://dx.doi.org/10.1049/PBCS045E Also available remotely for University of the Philippines Diliman via IET Digital Library. Click here to access thru EZproxy https://digital-library-theiet-org.ezproxy.engglib.upd.edu.ph/content/books/cs/pbcs045e (viewed 22 June 2021) FO UPD DENG-II Electronic Resource