Test generation of crosstalk delay faults in VLSI circuits

Test generation of crosstalk delay faults in VLSI circuits

מידע ביבליוגרפי
Main Authors: Jayanthy, S. (Author), Bhuvaneswari, M.C (Author)
מחבר תאגידי: SpringerLink (Online service)
פורמט: Electronic Resource
שפה:English
יצא לאור: Singapore Springer [2019]
מהדורה:First edition.
נושאים:
Computer software-Reusability.
Electronic circuits.
Logic design.
Microprogramming.
Electronic books.
גישה מקוונת:Available for University of the Philippines Diliman via SpringerLink. Click here to access
Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy