Test generation of crosstalk delay faults in VLSI circuits

Test generation of crosstalk delay faults in VLSI circuits

Библиографические подробности
Главные авторы: Jayanthy, S. (Автор), Bhuvaneswari, M.C (Автор)
Соавтор: SpringerLink (Online service)
Формат: Electronic Resource
Язык:English
Опубликовано: Singapore Springer [2019]
Редактирование:First edition.
Предметы:
Computer software-Reusability.
Electronic circuits.
Logic design.
Microprogramming.
Electronic books.
Online-ссылка:Available for University of the Philippines Diliman via SpringerLink. Click here to access
Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy