Multi-run memory tests for pattern sensitive faults

Dettagli Bibliografici
Autore principale:	Mrozek, Ireneusz (Autore)
Ente Autore:	SpringerLink (Online service)
Natura:	Electronic Resource
Lingua:	English
Pubblicazione:	Cham Springer International Publishing [2019]
Edizione:	First edition.
Soggetti:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Accesso online:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy