Multi-run memory tests for pattern sensitive faults

Bibliografski detalji
Glavni autor:	Mrozek, Ireneusz (Autor)
Autor kompanije:	SpringerLink (Online service)
Format:	Electronic Resource
Jezik:	English
Izdano:	Cham Springer International Publishing [2019]
Izdanje:	First edition.
Teme:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Online pristup:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy