Multi-run memory tests for pattern sensitive faults

Manylion Llyfryddiaeth
Prif Awdur:	Mrozek, Ireneusz (Awdur)
Awdur Corfforaethol:	SpringerLink (Online service)
Fformat:	Electronic Resource
Iaith:	English
Cyhoeddwyd:	Cham Springer International Publishing [2019]
Rhifyn:	First edition.
Pynciau:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Mynediad Ar-lein:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy