Multi-run memory tests for pattern sensitive faults

Détails bibliographiques
Auteur principal:	Mrozek, Ireneusz (Auteur)
Collectivité auteur:	SpringerLink (Online service)
Format:	Electronic Resource
Langue:	English
Publié:	Cham Springer International Publishing [2019]
Édition:	First edition.
Sujets:	Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books.
Accès en ligne:	Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy