Multi-run memory tests for pattern sensitive faults
| Egile nagusia: | |
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| Erakunde egilea: | |
| Formatua: | Electronic Resource |
| Hizkuntza: | English |
| Argitaratua: |
Cham
Springer International Publishing
[2019]
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| Edizioa: | First edition. |
| Gaiak: | |
| Sarrera elektronikoa: | Available for University of the Philippines Diliman via SpringerLink. Click here to access Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy |