00000cmm a22000004i 4500 UP-99796217613707856 Buklod 20210519100602.0 m |o d | cr || |||a|a|a 180706s2019 xx |||| o u | eng d 9783319912042 (eBook ISBN) (iLib)UPD-00523177609 DLC DENGII rda eng TK 7888.4 M76 2019eb Mrozek, Ireneusz author. Multi-run memory tests for pattern sensitive faults Ireneusz Mrozek. First edition. Cham Springer International Publishing [2019] 1 online resource. text rdacontent computer rdamedia online resource rdacarrier Introduction to digital memory -- Basics of functional RAM testing -- Multi-cell faults -- Controlled random testing -- Multi-run tests based on background changing -- Multi-run tests based on address changing -- Multiple controlled random testing -- Pseudo exhaustive testing based on march tests -- Conclusion. IP based subscription, on campus and remote access. Access via Electronic Resources of the UPD Engineering Library and University Library websites. Electronic reproduction. Cham Springer 2019. Available via World Wide Web through SpringerLink. Electronic circuits. Electronics. Microelectronics. Microprocessors. Electronic books. SpringerLink (Online service). Available for University of the Philippines Diliman via SpringerLink. Click here to access http://doi.org/10.1007/978-3-319-91204-2 Also available remotely for University of the Philippines Diliman via SpringerLink. Click here to access thru EZproxy https://link.springer.com.ezproxy.engglib.upd.edu.ph/book/10.1007%2F978-3-319-91204-2 (viewed 19 May 2021) FO UPD DENG-II Electronic Resource