Mrozek, I. (2019). Multi-run memory tests for pattern sensitive faults (First edition.). Springer International Publishing. https://doi.org/10.1007/978-3-319-91204-2
Čikaški stil citiranja (17. izdanje)Mrozek, Ireneusz. Multi-run Memory Tests for Pattern Sensitive Faults. First edition. Cham: Springer International Publishing, 2019. https://doi.org/10.1007/978-3-319-91204-2.
MLA način citiranja (9. izdanje)Mrozek, Ireneusz. Multi-run Memory Tests for Pattern Sensitive Faults. First edition. Springer International Publishing, 2019. https://doi.org/10.1007/978-3-319-91204-2.
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