Cita APA (7a ed.)

Mrozek, I. (2019). Multi-run memory tests for pattern sensitive faults (First edition.). Springer International Publishing. https://doi.org/10.1007/978-3-319-91204-2

Cita Chicago Style (17a ed.)

Mrozek, Ireneusz. Multi-run Memory Tests for Pattern Sensitive Faults. First edition. Cham: Springer International Publishing, 2019. https://doi.org/10.1007/978-3-319-91204-2.

Cita MLA (9a ed.)

Mrozek, Ireneusz. Multi-run Memory Tests for Pattern Sensitive Faults. First edition. Springer International Publishing, 2019. https://doi.org/10.1007/978-3-319-91204-2.