Timing performance of nanometer digital circuits under process variations

Detalles Bibliográficos
Autores principales:	Champac, Victor (Autor), Garcia Gervacio, Jose (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	Electronic Resource
Lenguaje:	English
Publicado:	Cham Springer International Publishing [2018] Washington, DC Island Press [2018]
Colección:	Frontiers in Electronic Testing
Materias:	Systems engineering. Computer science. Electronics. Electronic books.
Acceso en línea:	Available for University of the Philippines System via SpringerLink. Click here to access Also available remotely for University of the Philippines System via SpringerLink. Click here to access thru EZproxy