Cita APA (7th ed.)

Lienig, J., & Thiele, M. (2018). Fundamentals of electromigration-aware integrated circuit design. Springer International Publishing. https://doi.org/10.1007/978-3-319-73558-0

Cita Chicago (17th ed.)

Lienig, Jens, i Matthias Thiele. Fundamentals of Electromigration-aware Integrated Circuit Design. Cham: Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-73558-0.

Cita MLA (9th ed.)

Lienig, Jens, i Matthias Thiele. Fundamentals of Electromigration-aware Integrated Circuit Design. Springer International Publishing, 2018. https://doi.org/10.1007/978-3-319-73558-0.