Semiconductor materials analysis and fabrication process control a volume in European materials research society symposia proceedings

Podrobná bibliografie
Další autoři:	Crean, G. M. (Editor), Stuck, R. (Editor), Woollam, John A. (Editor)
Médium:	Electronic Resource
Jazyk:	English
Vydáno:	Amsterdam North-Holland [1993]
Témata:	Semiconductors > Analysis > Congresses. Semiconductors > Quality control > Congresses. Semiconductors > Optical properties > Congresses. Electronic books.
On-line přístup:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy