Semiconductor materials analysis and fabrication process control a volume in European materials research society symposia proceedings

Détails bibliographiques
Autres auteurs:	Crean, G. M. (Éditeur intellectuel), Stuck, R. (Éditeur intellectuel), Woollam, John A. (Éditeur intellectuel)
Format:	Electronic Resource
Langue:	English
Publié:	Amsterdam North-Holland [1993]
Sujets:	Semiconductors > Analysis > Congresses. Semiconductors > Quality control > Congresses. Semiconductors > Optical properties > Congresses. Electronic books.
Accès en ligne:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy