Semiconductor materials analysis and fabrication process control a volume in European materials research society symposia proceedings

Bibliographische Detailangaben
Weitere Verfasser:	Crean, G. M. (HerausgeberIn), Stuck, R. (HerausgeberIn), Woollam, John A. (HerausgeberIn)
Format:	Electronic Resource
Sprache:	English
Veröffentlicht:	Amsterdam North-Holland [1993]
Schlagworte:	Semiconductors > Analysis > Congresses. Semiconductors > Quality control > Congresses. Semiconductors > Optical properties > Congresses. Electronic books.
Online Zugang:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy