Semiconductor materials analysis and fabrication process control a volume in European materials research society symposia proceedings

Opis bibliograficzny
Kolejni autorzy:	Crean, G. M. (Redaktor), Stuck, R. (Redaktor), Woollam, John A. (Redaktor)
Format:	Electronic Resource
Język:	English
Wydane:	Amsterdam North-Holland [1993]
Hasła przedmiotowe:	Semiconductors > Analysis > Congresses. Semiconductors > Quality control > Congresses. Semiconductors > Optical properties > Congresses. Electronic books.
Dostęp online:	Available for University of the Philippines System via ScienceDirect. Click here to access Also available remotely for University of the Philippines System via ScienceDirect. Click here to access thru EZproxy