Diffraction and imaging techniques in material science - Amelinckx, S. (Severin); Gevers, R.; Landuyt, J. van (Amsterdam Elsevier, 1978)
v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques.
Includes bibliographical references and index.
Keywords: Electron microscopy -- Congresses; Electrons -- Diffraction -- Congresses; Imaging systems -- Congresses; Electronic books