C,H,N and O in Si and characterization and simulation of materials and processes A volume in European materials research society symposia proceedings

C,H,N and O in Si and characterization and simulation of materials and processes A volume in European materials research society symposia proceedings

Bibliografische gegevens
Andere auteurs: Borghesi, A. (Redacteur), Gosele, U.M (Redacteur), Vanhellemont, J. (Redacteur), Djafari-Rouhani, M. (Redacteur), Gue, A.M (Redacteur)
Formaat: Electronic Resource
Taal:English
Gepubliceerd in: Amsterdam Elsevier [1996]
Onderwerpen:
Semiconductors > Congresses.
Silicon > Congresses.
Semiconductors > Defects > Congresses.
Electronic books.
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