TY  - GEN
T1  - Contactless VLSI measurement and testing techniques
A1  - Sayil, Selahattin
LA  - English
PP  - Cham
PB  - Springer International Publishing AG
YR  - 2018
UL  - https://tuklas.up.edu.ph/Record/UP-99796217613332071
SN  - 9783319696737 (online ISBN)
KW  - Integrated circuits : Very large scale integration.
KW  - Electronic books.
ER  -