APA (7th ed.) Citation

Sayil, S. (2018). Contactless VLSI measurement and testing techniques. Springer International Publishing AG. https://doi.org/10.1007/978-3-319-69673-7

Chicago Style (17th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. Cham: Springer International Publishing AG, 2018. https://doi.org/10.1007/978-3-319-69673-7.

MLA (9th ed.) Citation

Sayil, Selahattin. Contactless VLSI Measurement and Testing Techniques. Springer International Publishing AG, 2018. https://doi.org/10.1007/978-3-319-69673-7.