Chen, Z. (2017). Data-driven fault detection for industrial processes: Canonical correlation analysis and projection based methods. Springer Vieweg. https://doi.org/10.1007/978-3-658-16756-1
Chicago Style (17th ed.) CitationChen, Zhiwen. Data-driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. Wiesbaden, Germany: Springer Vieweg, 2017. https://doi.org/10.1007/978-3-658-16756-1.
MLA (9th ed.) CitationChen, Zhiwen. Data-driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods. Springer Vieweg, 2017. https://doi.org/10.1007/978-3-658-16756-1.
Warning: These citations may not always be 100% accurate.