Wang, R., & Chakrabarty, K. (2017). Testing of interposer-based 2.5D integrated circuits. Springer. https://doi.org/10.1007/978-3-319-54714-5
Citazione stile Chigago Style (17a edizione)Wang, Ran, e Krishnendu Chakrabarty. Testing of Interposer-based 2.5D Integrated Circuits. Cham: Springer, 2017. https://doi.org/10.1007/978-3-319-54714-5.
Citatione MLA (9a ed.)Wang, Ran, e Krishnendu Chakrabarty. Testing of Interposer-based 2.5D Integrated Circuits. Springer, 2017. https://doi.org/10.1007/978-3-319-54714-5.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.