Control charts for simultaneous monitoring of parameters of a shifted exponential distribution

Bibliografische gegevens
Gepubliceerd in:	Journal of quality technology 47, 2 (2015 (Ap)).
Hoofdauteur:	Mukherjee, A
Andere auteurs:	McCracken, A. K., Chakraborti, S.
Formaat:	Artikel
Taal:	English
Onderwerpen:	Average run length. In control. Joint monitoring. Maximum likelihood. Origin and scale. Out of control. Probability integral transform.