Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits - Bushnell, Michael L. (Michael Lee) 1950-; Agrawal, Vishwani D. 1943- (New York, N.Y. Springer, 2000)
Also available in print version.
Electronic reproduction.
Keywords: Integrated circuits -- Very large scale integration -- Testing; Digital integrated circuits -- Testing; Mixed signal circuits -- Testing; Semiconductor storage devices -- Testing; Electronic books