Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

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Opis bibliograficzny
Główni autorzy: Bushnell, Michael L. (Michael Lee) 1950- (Autor), Agrawal, Vishwani D. 1943- (Autor)
Format: Electronic Resource
Język:English
Wydane: New York, N.Y. Springer [2000]
Hasła przedmiotowe:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Electronic books.
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