Two-dimensional parametric mapping and characterization of semiconductor devices using optical-feedback confocal microscopy
A method of measuring very important two-dimensional parameters of semiconductor devices is demonstrated using an optical feedback confocal microscope. By utilizing different wavelength laser diodes for the microscope, either photothermal stimulation or photoexcitationn of the semiconducting samples...
| প্রধান লেখক: | |
|---|---|
| অন্যান্য লেখক: | |
| বিন্যাস: | গবেষণাপত্র |
| ভাষা: | English |
| প্রকাশিত: |
Quezon City
National Institute of Physics, College of Science, University of the Philippines Diliman
2009.
|
| বিষয়গুলি: |