APA (7th ed.) Citation

Sarmiento, R. L. A. C., & Saloma, C. A. (2009). Two-dimensional parametric mapping and characterization of semiconductor devices using optical-feedback confocal microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman.

Chicago Style (17th ed.) Citation

Sarmiento, Raymund Lee Antonio C., and Caesar A. Saloma. Two-dimensional Parametric Mapping and Characterization of Semiconductor Devices Using Optical-feedback Confocal Microscopy. Quezon City: National Institute of Physics, College of Science, University of the Philippines Diliman, 2009.

MLA (9th ed.) Citation

Sarmiento, Raymund Lee Antonio C., and Caesar A. Saloma. Two-dimensional Parametric Mapping and Characterization of Semiconductor Devices Using Optical-feedback Confocal Microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman, 2009.