Cemine, V. J. R., & Blanca, C. M. Y. (2007). Novel techniques in semiconductor characterization and failure analysis using optical feedback laser scanning microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman.
Цитирование в стиле Чикаго (17-е изд.)Cemine, Vernon Julius R., и Carlo Mar Y. Blanca. Novel Techniques in Semiconductor Characterization and Failure Analysis Using Optical Feedback Laser Scanning Microscopy. Quezon City: National Institute of Physics, College of Science, University of the Philippines Diliman, 2007.
Цитирование MLA (9-е изд.)Cemine, Vernon Julius R., и Carlo Mar Y. Blanca. Novel Techniques in Semiconductor Characterization and Failure Analysis Using Optical Feedback Laser Scanning Microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman, 2007.