Cemine, V. J. R., & Blanca, C. M. Y. (2007). Novel techniques in semiconductor characterization and failure analysis using optical feedback laser scanning microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman.
Chicago Style (17th ed.) CitationCemine, Vernon Julius R., and Carlo Mar Y. Blanca. Novel Techniques in Semiconductor Characterization and Failure Analysis Using Optical Feedback Laser Scanning Microscopy. Quezon City: National Institute of Physics, College of Science, University of the Philippines Diliman, 2007.
MLA (9th ed.) CitationCemine, Vernon Julius R., and Carlo Mar Y. Blanca. Novel Techniques in Semiconductor Characterization and Failure Analysis Using Optical Feedback Laser Scanning Microscopy. National Institute of Physics, College of Science, University of the Philippines Diliman, 2007.