CMOS test and evaluation a physical perspective - Bhushan, Manjul; Ketchen, Mark B.; SpringerLink (Online service). (New York, NY Springer New York, 2015)
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
Electronic reproduction.
Keywords: System safety; Electronics; Systems engineering; Electronic books