Bhushan, M., & Ketchen, M. B. (2015). CMOS test and evaluation: A physical perspective. Springer New York. https://doi.org/10.1007/978-1-4939-1349-7
Citazione stile Chigago Style (17a edizione)Bhushan, Manjul, e Mark B. Ketchen. CMOS Test and Evaluation: A Physical Perspective. New York, NY: Springer New York, 2015. https://doi.org/10.1007/978-1-4939-1349-7.
Citatione MLA (9a ed.)Bhushan, Manjul, e Mark B. Ketchen. CMOS Test and Evaluation: A Physical Perspective. Springer New York, 2015. https://doi.org/10.1007/978-1-4939-1349-7.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.