Circuit design for reliability - Reis, Ricardo A. L. (Ricardo Augusto da Luz).; Cao, Yu (Computer scientist); Wirth, Gilson; SpringerLink (Online service). (New York, NY Springer New York, 2015)
Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
Electronic reproduction.
Keywords: Integrated circuits -- Reliability; Integrated circuits -- Design and construction; Electronic books