Style de citation APA (7e éd.)

Sun, Y. (2008). Test and diagnosis of analogue, mixed-signal and RF integrated circuits: The system on chip approach. Institution of Engineering and Technology. https://doi.org/10.1049/PBCS019E

Style de citation Chicago (17e éd.)

Sun, Yichuang. Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: The System on Chip Approach. London, United Kingdom: Institution of Engineering and Technology, 2008. https://doi.org/10.1049/PBCS019E.

Style de citation MLA (9e éd.)

Sun, Yichuang. Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits: The System on Chip Approach. Institution of Engineering and Technology, 2008. https://doi.org/10.1049/PBCS019E.