VLSI testing digital and mixed analogue/digital techniques

The importance of testing integrated circuits (ICs) has escalated with the increasing complexity of circuits fabricated on a single IC chip. No longer is it possible to design a new IC and then think about testing: such considerations must be part of the initial design activity, and testing strategi...

詳細記述

書誌詳細
第一著者:	Hurst, Stanley L. (著者)
フォーマット:	Electronic Resource
言語:	English
出版事項:	London, United Kingdom Institution of Engineering and Technology 1998.
主題:	Integrated circuits > Very large scale integration > Testing. Application-specific integrated circuits. Electronic books.
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