Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. Institution of Engineering and Technology. https://doi.org/10.1049/PBCS009E
Chicago Style (17th ed.) CitationHurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. London, United Kingdom: Institution of Engineering and Technology, 1998. https://doi.org/10.1049/PBCS009E.
MLA (9th ed.) CitationHurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Institution of Engineering and Technology, 1998. https://doi.org/10.1049/PBCS009E.
Warning: These citations may not always be 100% accurate.