Hurst, S. L. (1998). VLSI testing: Digital and mixed analogue/digital techniques. Institution of Engineering and Technology. https://doi.org/10.1049/PBCS009E
Citace podle Chicago (17th ed.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. London, United Kingdom: Institution of Engineering and Technology, 1998. https://doi.org/10.1049/PBCS009E.
Citace podle MLA (9th ed.)Hurst, Stanley L. VLSI Testing: Digital and Mixed Analogue/digital Techniques. Institution of Engineering and Technology, 1998. https://doi.org/10.1049/PBCS009E.
Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..