TY  - THES
T1  - Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques
A1  - Tarun, Alvarado B.
A2  - Saloma, Caesar A.
LA  - English
UL  - https://tuklas.up.edu.ph/Record/UP-99796217612317771
CN  - LG 996 2006 P51 T37
KW  - Integrated circuits : Reliability.
ER  -