Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques

Podrobná bibliografie
Hlavní autor:	Tarun, Alvarado B. (Autor)
Další autoři:	Saloma, Caesar A. (thesis adviser.)
Médium:	Diplomová práce
Jazyk:	English
Témata:	Integrated circuits > Reliability.