Cita APA (7th ed.)

Tarun, A. B., & Saloma, C. A. Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques.

Cita Chicago (17th ed.)

Tarun, Alvarado B., i Caesar A. Saloma. Nondestructive and Subsurface Defect Detection in Integrated Circuits Using Advanced Microscopy and Spectroscopy Techniques.

Cita MLA (9th ed.)

Tarun, Alvarado B., i Caesar A. Saloma. Nondestructive and Subsurface Defect Detection in Integrated Circuits Using Advanced Microscopy and Spectroscopy Techniques.