Tarun, A. B., & Saloma, C. A. Nondestructive and subsurface defect detection in integrated circuits using advanced microscopy and spectroscopy techniques.
Chicago Style (17th ed.) CitationTarun, Alvarado B., and Caesar A. Saloma. Nondestructive and Subsurface Defect Detection in Integrated Circuits Using Advanced Microscopy and Spectroscopy Techniques.
MLA (9th ed.) CitationTarun, Alvarado B., and Caesar A. Saloma. Nondestructive and Subsurface Defect Detection in Integrated Circuits Using Advanced Microscopy and Spectroscopy Techniques.
Warning: These citations may not always be 100% accurate.