Electrical overstress (EOS) devices, circuits, and systems

Electrical overstress (EOS) devices, circuits, and systems

Dades bibliogràfiques
Autor principal: Voldman, Steven H. (Autor)
Format: Llibre
Idioma:English
Publicat: Chichester, West Sussex, United Kingdom John Wiley & Sons Inc. 2014.
Matèries:
Semiconductors > Failures.
Semiconductors > Protection.
Transients (Electricity)
Overvoltage.