Electrical overstress (EOS) devices, circuits, and systems

Electrical overstress (EOS) devices, circuits, and systems

Xehetasun bibliografikoak
Egile nagusia: Voldman, Steven H. (Egilea)
Formatua: Liburua
Hizkuntza:English
Argitaratua: Chichester, West Sussex, United Kingdom John Wiley & Sons Inc. 2014.
Gaiak:
Semiconductors > Failures.
Semiconductors > Protection.
Transients (Electricity)
Overvoltage.