Fundamentals of modern VLSI devices

Detalles Bibliográficos
Autor Principal:	Taur, Yuan 1946-
Outros autores:	Ning, Tak H. 1943-
Formato:	Libro
Idioma:	English
Publicado:	New York Cambridge University Press 2009.
Edición:	2nd ed.
Subjects:	Metal oxide semiconductors, Complementary. Bipolar transistors. Integrated circuits > Very large scale integration.