More pitfalls of accelerated tests.
As product-development cycles become shorter and companies demand more rapid achievement of reliability goals, it is becoming more and more important to use quantitative accelerated life tests (ALT) to predict and improve reliability. Today there is an abundance of methods to pland and analyze accel...
| 出版年: | Journal of Quality Technology 45, 3 (2013). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
| 主題: |