Meeker, W. Q. More pitfalls of accelerated tests. Journal of Quality Technology.
Chicago Style (17th ed.) CitationMeeker, William Q. "More Pitfalls of Accelerated Tests." Journal of Quality Technology .
MLA引文Meeker, William Q. "More Pitfalls of Accelerated Tests." Journal of Quality Technology, .
警告:這些引文格式不一定是100%准確.