00000cmm a22000004a 4500 UP-99796217611212087 Buklod 20140424081839.0 m go j cr |nu|||auu|a 140424s2011 xx d u 9781441957603 (eBook) 144195760X (eBook) (iLib)UPD-00214608244 DML eng DMLUC TK 7835 R45 2011eb Reliability of microtechnology [electronic resource] interconnects, devices, and systems by Johan Liu ... [et.al.]. New York Springer New York 2011. 1 online resource(xiii, 204p.) ill. Introduction to Reliability and its Importance -- Reliability Metrology -- General Failure Mechanisms of Microsystems -- Solder and Conductive Adhesive Joint Reliability -- Accelerated Testing -- Reliability Design for Manufacturability -- Component Reliability -- System Level Reliability -- Reliability and Quality Management of Microsystem -- Experimental Tools for Reliability Analysis. IP-based subscription, access limited to within on-campus computer network. Access via Electronic Resources of the UPD University Library Website. It is well known that reliability and dependability are assuminga strategic role in all contexts where productperformance and safety are specific requirements. To this purpose this book representsa practical guide for designers and users in Information and Communication Technology area and for those that treat the different stages of the life cycle of products. Starting from the definition of the fundamental terms according to the international standards, basic techniques for the evaluation of the reliability of components and systems are presented. A specific feature of this book is to describe reliability concepts starting from an experimental point of view: for this reason particular attention has beenpaid to laboratory tests. For instance in ICT area, a practical way for evaluating the failure rate for a given system is to use properreliability prediction handbooks. In the book manyexamples are reported to this purpose. Last, the more complex aspects regarding the Dependability of complex systems are taken into account; in particular, some fundamental techniques such as FMECA (Failure Mode, Effects, and Criticality Analysis) and FTA (Fault Tree Analysis) are presented with examples for reparable systems. Electronic reproduction. New York SpringerLink 2011. Available via World Wide Web through SpringerLink. Microtechnology Reliability. Electronic books. Liu, Johan. SpringerLink (Online service). Available for University of the Philippines Diliman via SpringerLink. Click here to access http://link.springer.com/book/10.1007/978-1-4419-5760-3 FO Monograph UPD DMLR Electronic Resource