Predictive technology model for robust nanoelectronic design

Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device mod...

詳細記述

書誌詳細
第一著者: Cao, Yu
団体著者: SpringerLink (Online service)
フォーマット: Electronic Resource
言語:English
出版事項: Boston, MA Springer US 2011.
シリーズ:Integrated Circuits and Systems
主題:
オンライン・アクセス:Available for University of the Philippines Diliman via SpringerLink. Click here to access