00000cmm a22000004a 4500 UP-99796217611211975 Buklod 20140423140438.0 m go j cr cn |||aaaaa 110110s2011 xxu u eng d 9781441979582 (eBook) (iLib)UPD-00214608117 DLC DML eng DMLUC TK 7895 M4 H67 2011eb Horiguchi, Masashi. Nanoscale memory repair [electronic resource] Masashi Horiguchi, Kiyoo Itoh. New York Springer c2011. 1 online resource (ix, 215 p.) ill. Integrated circuits and systems 1558-9412 An Introduction to Repair Techniques: Basics of Redundancy -- Basics of Error Checking and Correction -- Comparison between Redundancy and ECC -- Repairs of Logic Circuits -- Redundancy: Models of Fault Distribution -- Yield Improvement through Redundancy -- Replacement Schemes -- Intra-Subarray Replacement -- Inter-Subarray Replacement -- Subarray Replacement -- Devices for Storing Addresses -- Testing for Redundancy -- Error Checking and Correction: Linear Algebra and Linear Codes -- Galois Field -- Error-Correcting Codes -- Coding and Decoding Circuits -- Theoretical Reduction in Soft-Error and Hard-Error Rates -- Application of ECC -- Testing for ECC -- Synergistic Effect of Redundancy and ECC: Repair of Bit Faults using Synergistic Effect -- Application of Synergistic Effect. IP-based subscription, access limited to within on-campus computer network. Access via Electronic Resources of the UPD University Library Website. Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. As a result, repair techniques have been indispensable for nano-scale memories. Without these techniques, even modern MPUs/ SoCs, in which memories have dominated the area and performance, could not have been designed successfully. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors? long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability. Presents the first comprehensive reference to reliability and repair techniques for nano-scale memories; Covers both the mathematical foundations and engineering applications of yield and reliability in nano-scale memories; Includes a variety of practical circuits and logic, critical for higher yield and reliability, which have been proven successful during the authors? extensive experience in developing memories and low-voltage CMOS circuits. Electronic reproduction. New York SpringerLink c2011. Available via World Wide Web through SpringerLink. Semiconductor storage devices Maintenance and repair. Semiconductor storage devices Design and construction. Semiconductor storage devices Reliability. Nanoelectronics. Integrated circuits Fault tolerance. Electronic books. Itoh, Kiyoo 1941-. SpringerLink (Online service). Available for University of the Philippines Diliman via SpringerLink. Click here to access http://dx.doi.org/10.1007/978-1-4419-7958-2 FO Monograph UPD DMLR Electronic Resource